Semiconductor lighting inspection technology and standards: Cross-strait testing has begun


Following the “Cross-Strait LED Lighting Industry Cooperation and Exchange Conference” held in June last year, the two sides have reached consensus on building a communication platform and standard testing cooperation, and achieved initial results. Hua Shuming, director of the National Electric Light Source Quality Supervision and Inspection Center (Beijing), said that the two sides have begun to send samples for testing and comparison work, and hope that the future will gradually cooperate in photometry, colorimetry, comparison and analysis. In addition, he said that the mainland is also planning to implement voluntary testing and energy-saving certification this year, which will improve the current lack of standards for semiconductor lighting. I hope that the two sides can also cooperate in this regard.

In the past 100 years, basic subjects such as photometry and colorimetry have been based on the physiological characteristics of Europeans and Americans. Asians lack their own photometric evaluation and spectroscopy research. Hua Shuming also hopes that the two sides can achieve luminosity assessment and spectroscopy research. Cooperation and long-term research. Li Liling, deputy head of the Institute of Industrial Science and Technology of Taiwan Institute of Technology, also said that it is necessary for Asian photosensitivity and colorimetry research, and she hopes that the two sides will have better cooperation in safety performance testing. In addition, cross-straits can build product databases to facilitate the screening of better companies and products.

Li Jintao, director of the Institute of Semiconductors of the Chinese Academy of Sciences, also said that cross-strait cooperation in standards and testing methods, including testing and mutual recognition, is very important. He said: "At present, there is a problem with the lighting. It is difficult to distinguish whether it is a light source or a driving problem. It is inevitable that there will be a 'fighting' situation. Therefore, the two sides should carry out chip-level testing, and fundamentally solve this problem from the detection method."

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